标准摘要
[中文适用范围]： 描述了现场测量晶体硅光伏阵列特性以及将这些数据外推到标准测试条件或其他选定的温度和辐照度值的程序。 [外文原描述]： Describes procedures for on-site measurement of crystalline silicon photovoltaic (PV) array characteristics and for extrapolating these data to Standard Test Conditions (STC) or other selected temperatures and irradiance values.
英文名称Crystalline silicon photovoltaic (PV) array - On-site measurement of I-V characteristics