集成电路电磁辐射测量第1部分:一般条件和定义

[中文适用范围]： IEC 61967-1 提供了关于集成电路传导和辐射电磁干扰测量的通用信息和定义。它还提供了测量条件、测试设备以及设置的描述，以及测试程序和测试报告的内容。 annex A 中包含了测试方法比较表，以协助选择合适的测量方法。该文件的目的是描述通用条件，以建立统一的测试环境，并获得集成电路射频干扰的定量测量值。预计影响测试结果的关键参数进行了描述。对本文档的偏离将在单独的测试报告中明确注明。测量结果可用于比较或其他目的。在受控条件下测量来自集成电路的传导射频干扰的电压和电流或辐射射频干扰，可产生有关集成电路在应用中产生射频干扰潜力的信息。适用的频率范围在 IEC 61967 系列的每个部分中都有描述。 [外文原描述]： IEC 61967-1:2018 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are include in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967. This edition includes the following significant technical changes with respect to the previous edition: - the frequency range of 150 kHz to 1 GHz has been deleted from the title; - the frequency step above 1 GHz has been added to Table 1, Table 2 and to 5.4; - Table A.1 has been divided into two tables, and IEC 61967-8 has been added to Table A.2 of Annex A; - the general test board description has been moved to Annex D.