集成电路.150kHz-1GHz电磁辐射的测量.第2部分:辐射释放测量.TEM辐射室和宽频TEM辐射室法

[中文适用范围]： 该测试程序定义了一种测量集成电路 (IC) 电磁辐射的方法。被评估的 IC 安装在 IC 测试印刷电路板 (PCB) 上，该印刷电路板夹在横向电磁 (TEM) 或宽带千兆赫 TEM (GTEM) 顶部或底部切割的配合端口（称为墙壁端口）上。 ） 细胞。测试板不像常规使用那样位于电池内部，而是成为电池壁的一部分。该方法适用于任何经过改造以合并壁端口的 TEM 或 GTEM 单元；然而，测量的射频（RF）电压会受到许多因素的影响。影响测量的 RF 电压的主要因素是隔膜与 IC 测试板（单元壁）的间距。该程序是使用隔膜到底板间距为 45 mm 的 1 GHz TEM 单元和端口区域上隔膜到底板平均间距为 45 mm 的 GTEM 单元开发的。其他电池可能不会产生相同的光谱输出，但可用于比较测量，但受其频率和灵敏度限制。转换因子可以允许在具有不同隔膜到地板间距的 TEM 或 GTEM 单元上测量的数据之间进行比较。 IC 测试板控制操作 IC 相对于电池的几何形状和方向，并消除电池内的任何连接引线（这些引线位于电路板的背面，位于电池外部）。对于 TEM 池，50 Ω 端口之一端接 50 Ω 负载。 TEM 池的另一个 50 Ω 端口或 GTEM 池的单个 50 Ω 端口连接到频谱分析仪或接收器的输入，用于测量从集成电路发出并印在池隔膜上的 RF 发射。 [外文原描述]： This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell. The test board is not inside the cell, as in the conventional usage, but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured radio frequency (RF) voltage will be affected by many factors. The primary factor affecting the measured RF voltage is the septum to IC test board (cell wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to floor spacing of 45 mm and a GTEM cell with average septum to floor spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations. A conversion factor may allow comparisons between data measured on TEM or GTEM cells with different septum to floor spacing. The IC test board controls the geometry and orientation of the operating IC relative to the cell and eliminates any connecting leads within the cell (these are on the backside of the board, which is outside the cell). For the TEM cell, one of the 50 ports is terminated with a 50 load. The other 50 port for a TEM cell, or the single 50 port for a GTEM cell, is connected to the input of a spectrum analyser or receiver that measures the RF emissions emanating from the integrated circuit and impressed onto the septum of the cell.