标准摘要
[中文适用范围]： 本部分IEC 61967规定了一种使用微型磁探头进行非接触式电流测量，以评估集成电路（IC）引脚上射频电流的方法。该方法能够测量集成电路在0.15 MHz至1000 MHz频率范围内产生的射频电流。该方法适用于在标准化测试板上对单个IC或IC芯片组进行表征和比较的测量。它也可用于评估实际应用PCB上IC或IC组的电磁特性，以减少电磁发射。该方法称为“磁探头法”。 [外文原描述]： IEC 61967-6 Ed 1.1:2008 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method". This consolidated version consists of the first edition (2002) and its amendment 1 (2008). Therefore, no need to order amendment in addition to this publication.
英文名称Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method