标准摘要
[中文适用范围]： 指定一种通过使用微型磁性探针进行非接触式电流测量来评估集成电路 (IC) 引脚上射频电流的方法。该方法能够测量 IC 在某个频率上产生的 RF 电流 [外文原描述]： Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.
英文名称Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method