标准摘要
[中文适用范围]： 本部分IEC 62047规定了柔性机电设备在循环弯曲变形后电气特性的测试方法。这些设备包括柔性薄膜上或嵌入柔性薄膜中的无源微组件和有源微组件。测试方法的预期平面尺寸通常为1毫米至300毫米，厚度范围为10微米至1毫米，但这些不是限制值。测试方法旨在通过3D（P-S-N：性能-弯曲严重程度-循环次数）图来理解和可视化循环弯曲变形后的整体性能退化行为。本文件对于估计在特定水平的循环弯曲变形下的安全裕度至关重要，并且对于使用这些设备的产品的可靠设计必不可少。 [外文原描述]： IEC 62047-43:2024 specifies the test method of electrical characteristics after cyclic bending deformation for flexible electromechanical devices. These devices include passive micro components and active micro components on the flexible film or embedded in the flexible film. The desired in-plane dimensions of the device for the test method ranges typically from 1 mm to 300 mm and the thickness ranges from 10 μm to 1 mm, but these are not limiting values. The test method is so designed as to understand and further visualize the entire performance deterioration behaviour after cyclic bending deformation in a concept of 3D (P-S-N: Performance - Severity of bending - Number of cycles) plot over the loading space of severity of bending and number of repeated cycles. This document is essential to estimate safety margin over the operation period under a certain level of cyclic bending deformation and indispensable for reliable design of the product employing these devices.
英文名称Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices