集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义

[中文适用范围]： IEC 62132 的这一部分提供了有关测量集成电路 (IC) 传导和辐射干扰的传导和辐射电磁抗扰度的一般信息和定义。它还提供了测量条件、测试设备和设置以及测试程序和测试报告内容的描述。附件 A 中包含测试方法比较表，以帮助选择适当的测量方法。该标准描述了在统一测试环境中获得 IC 抗扰度定量测量所需的一般条件。描述了预计会影响测试结果的关键参数。与此标准的偏差在单独的测试报告中明确注明。测量结果可用于比较或其他目的。对注入电压和电流的测量，以及在受控条件下测试的 IC 的响应，可得出有关 IC 在给定应用中对传导和辐射 RF 干扰的潜在抗扰度的信息。 [外文原描述]： This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.