集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

[中文适用范围]： 本部分IEC 62132提供了有关集成电路（IC）传导和辐射干扰电磁抗扰度测量的通用信息和定义。它还定义了所有IEC 62132系列部分的通用测试条件、测试设备和设置，以及测试程序和测试报告内容。附件A中包含测试方法比较表，以协助选择合适的测量方法。 [外文原描述]： IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 1 GHz has been deleted from the title; b) frequency step above 1 GHz has been added in Table 2 in 7.4.1; c) IC performance classes in 8.3 have been modified; d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.