标准摘要
[中文适用范围]： 本国际标准规定了测量集成电路（IC）对射频（RF）辐射电磁干扰的抗扰度的方法。该方法的频率范围为 150 kHz 至 1 GHz，或受 TEM 室特性的限制。 [外文原描述]： IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
英文名称Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method