集成电路.150kHz～1GHz电磁抗扰性的测量.第3部分:大容量电流注入(BCI)法

[中文适用范围]： IEC 621 32 的这一部分描述了一种大电流注入（BCI）测试方法，用于测量集成电路（IC）在存在传导射频干扰时的抗扰度，例如．此方法仅适用于具有板外接线的 IC，例如。 g． into a Cableharness．该测试方法用于在一根或多根电线上注入射频电流。该标准为评估在受到不需要的射频电磁信号的环境中使用的设备中应用的半导体器件建立了一个共同基础。 [外文原描述]： This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.