标准摘要
[中文适用范围]： IEC 62132 的这一部分描述了一种在存在传导射频干扰（例如由辐射射频干扰引起）的情况下测量集成电路 (IC) 抗扰度的方法。该方法保证了抗扰度测量的高度可重复性和相关性。该标准为评估在无用射频电磁波环境中运行的设备中使用的半导体器件建立了共同基础。 [外文原描述]： Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
英文名称Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method