集成电路 电磁耐受性测量 第8部分：IC带状线法辐射抗扰度测量

[中文适用范围]： IEC 62132-8:2026 RLV包含了官方的IEC国际标准及其红线版本。红线版本仅提供英文版，它为您提供了一种快速且简便的方式，用于比较官方IEC标准与其前一版之间的所有变更。IEC 62132-8:2026规定了使用集成电路（IC）微带线测量集成电路（IC）对射频（RF）辐射电磁干扰的抗扰度的方法。与前一版相比，本版包含以下重大技术变更：a）将频率范围150 kHz至3 GHz从适用范围中删除；b）只要满足定义的要求，将最高可用频率扩展至6 GHz或更高。IEC 62132的本部分应与IEC 62132-1结合阅读。 [外文原描述]： IEC 62132-8:2026 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 62132-8:2026 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances using an IC stripline. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled. This part of IEC 62132 is to be read in conjunction with IEC 62132-1.