标准摘要
[中文适用范围]： IEC 62215 的这项规定了测量集成电路 (IC) 对标准化传导电瞬态干扰的抗扰度的方法。这些干扰不一定与测试设备 (DUT) 的操作同步，通过耦合网络施加到 IC 引脚上。该方法能够理解和分类传导瞬态干扰与在 IC 中引起的性能退化之间的相互作用，无论瞬态是否在规定的工作电压范围内。 [外文原描述]： IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
英文名称Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method