表面声波（SAW）器件应用的单晶片 - 规范和测量方法

[中文适用范围]： IEC 62276:2025 适用于制造用作表面声波（SAW）滤波器和谐振器基板的合成石英、铌酸锂（LN）、钽酸锂（LT）、四硼酸锂（LBO）和镧镓硅酸（LGS）单晶片。与上一版相比，此版本包括以下重大技术变化：a) 增加了 LN 和 LT 的术语和定义、技术要求、采样频率、测试方法以及透过率、亮度、色差的测量，以适应行业发展的需要；b) 增加了术语“夹杂物”（在 4.13 和 6.10 中提到）及其定义，因为第 3 章中没有对此进行定义；c) 增加了 LTV 和 PLTV 的规定，以及 LN 和 LT 相应的采样频率的描述，因为它们是晶片的关键性能参数； d)增加了LN、LT居里温度规范的公差，以适应行业发展的要求；e)完成了厚度、TV5、TTV、LTV、PLTV的测量，包括厚度、TV5、TTV、LTV、PLTV的测量原理和方法。 [外文原描述]： IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development; b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3; c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers; d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry; e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.