标准摘要
[中文适用范围]： IEC 62396 的这一部分旨在提供与微电子设备测试相关的指导，以测量其对大气中子引起的单粒子效应 (SEE) 的敏感性。由于测试可以通过多种不同的方式@使用不同种类的辐射源@进行，因此还展示了如何使用测试数据来估计由于飞机高度处的大气中子而导致的设备和电路板的SEE率。虽然是为航空电子工业开发的，但该工艺也可以应用于其他工业部门。 [外文原描述]： IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2: - additional information on heavy ion data, neutron and proton data and thermal neutron data; - updates with regard to neutron sources: additional radiation simulators; - addition of the Anita spallation neutron source; - additional information on whole system and equipment testing; - comparison between accelerator based neutron sources.
英文名称Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems