标准摘要
[中文适用范围]： IEC 62396-2 旨在为用于测量电子元件受大气中由宇宙射线相互作用产生的中子（大气中子）引起的单粒子效应（SEE）影响的测试提供指导。由于测试可以通过多种不同的方式、使用不同类型的辐射源进行，本文件还展示了如何利用测试数据来估算电子元件和电路板在飞机高度下因大气中子引起的 SEE 速率。虽然该过程是为航空电子设备行业开发的，但其他工业部门也可以应用该过程。 [外文原描述]： IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.
英文名称Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems