标准摘要
[中文适用范围]： 该标准描述了金属线、通孔串和触点的常规恒流电迁移测试方法。 [外文原描述]： IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
英文名称Semiconductor devices - Constant current electromigration test