标准摘要
[中文适用范围]： 该标准描述了 NMOS 和 PMOS 晶体管的晶圆级热载流子测试。该测试旨在确定某个 (C)MOS 工艺中的单个晶体管是否满足所需的热载流子寿命。 [外文原描述]： IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
英文名称Semiconductor devices - Hot carrier test on MOS transistors