标准摘要
[中文适用范围]： IEC 62435 的这一部分与劣化机制相关，并涉及组件随着时间的推移而劣化的方式，具体取决于所应用的存储条件。本部分还包括可用于评估通用劣化机制的测试方法指南。通常，本部分与 IEC 62435-1 结合使用，用于任何长期存储的设备，对于计划长期存储的产品，其持续时间可能超过 12 个月。 IEC 62435-5 至 IEC 62435-9（建议）中详细介绍了适用于特定组件类型的机制。 [外文原描述]： IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.
英文名称Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms