光学电路板. 基本试验和测量程序. 第2部分: 光学电路板光学特性测量条件定义通用指南

[中文适用范围]： IEC 62496 的这一部分规定了定义光电路板光学特性测量条件的方法。该方法包括使用代码参考查找表来识别测量环境的不同关键方面。从表格中提取的值用于构建测量识别码，该识别码本身捕获有关测量条件的足够信息，以确保独立测量结果在可接受的范围内的一致性。指定推荐的测量条件是为了最大限度地减少独立测量结果的进一步变化。 [外文原描述]： IEC 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.