标准摘要
[中文适用范围]: 本文件提供了关于应用各种加速测试技术测量或改进产品可靠性的指南。识别产品在使用中可能遇到的潜在故障模式及其缓解措施对于确保产品的可靠性至关重要。这些方法的目的在于识别潜在的设计弱点,或在压缩或加速的时间段内提供关于产品可靠性的信息,或实现必要的可靠性和可用性改进。本文件适用于非可修复和可修复系统的加速测试,可用于概率比序列测试、固定持续时间测试以及可靠性改进/增长测试,其中可靠性度量可能与标准故障发生概率不同。本文件还扩展到介绍加速测试或生产筛选方法,这些方法可以识别由制造错误引入产品的弱点,这些弱点可能损害产品的可靠性。然而,服务和人员不在本文件范围内。 [外文原描述]: IEC 62506:2023 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 62506:2023 edition 2.0 and the previous IEC 62506:2013 edition 1.0. Furthermore, comments from IEC TC 56 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content. IEC 62506:2023 provides guidance on the application of various accelerated test techniques for measurement or improvement of item reliability. Identification of potential failure modes that can be experienced in the use of an item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item reliability, or to achieve necessary reliability and availability improvement, all within a compressed or accelerated period of time. This document addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability can differ from the standard probability of failure occurrence. This document also extends to present accelerated testing or production screening methods that would identify weakness introduced into the item by manufacturing error, which can compromise item reliability. Services and people are however not covered by this document.
英文名称Methods for product accelerated testing