标准摘要
[中文适用范围]： 本国际标准的目的是描述微波频率下介电板平面方向介电性能的测量方法。这种方法称为空腔谐振器方法。它的创建是为了开发新材料和设计微波有源和无源器件，其中材料性能测量方法的标准化变得越来越重要。该方法具有以下特点：相对介电常数??可以准确、无损地测量介电板样品的损耗角正切tanδ值； ？可以测量复介电常数的温度依赖性； ？ ??' 的测量精度在 0@3 % 以内tan?? 的误差在 5??10?C6 之内； ？使用在严格分析的基础上计算出的校正图表来校正边缘效应。该方法适用于以下条件下的测量： C频率：2GHz以下～40GHz以下； ?C相对介电常数：2小于??少于100； ?C损耗角正切：10?C6小于10-2。 [外文原描述]： IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version. This publication contains colours which are considered to be useful for the correct understanding of its contents.
英文名称Cavity resonator method to measure the complex permittivity of low-loss dielectric plates