静电放电敏感性测试.传输线脉冲(TLP).元件级别

[中文适用范围]： 该国际标准定义了一种脉冲测试方法，用于评估被测元件的电压电流响应，并考虑静电放电（ESD）人体模型（HBM）的保护设计参数。该技术称为传输线脉冲 (TLP) 测试。本文件建立了一种用于测试和报告与传输线脉冲 (TLP) 测试相关的信息的方法。本文档的范围和重点涉及半导体元件的 TLP 测试技术。本文件不应成为IEC 60749-26等HBM测试标准的替代方法。该文件的目的是建立 TLP 方法指南，以提取半导体器件上的 HBM ESD 参数。本文档提供了使用 TLP 正确提取 HBM ESD 参数的标准测量和程序。 [外文原描述]： IEC 62615:2010 defines a method for pulse testing to evaluate the voltage current response of the component under test and to consider protection design parameters for electro-static discharge (ESD) human body model (HBM). This technique is known as transmission line pulse (TLP) testing. This document establishes a methodology for both testing and reporting information associated with transmission line pulse (TLP) testing. The scope and focus of this document pertains to TLP testing techniques of semiconductor components. This document should not become alternative method of HBM test standard such as IEC 60749-26. The purpose of the document is to establish guidelines of TLP methods that allow the extraction of HBM ESD parameters on semiconductor devices. This document provides the standard measurement and procedure for the correct extraction of HBM ESD parameters by using TLP.