标准摘要
[中文适用范围]： IEC 62788 的这一部分提供了一种方法，用于测量封装片材料在不受限制的热暴露下线性尺寸的最大代表性变化，这种变化在光伏 (PV) 模块制造过程中可能会出现，也可能不会出现。该标准没有考虑由于模块制造过程中受限的尺寸变化或摩擦而可能产生的任何应力。封装材料制造商可以使用使用此方法获得的数据来控制其封装材料的质量以及在产品数据表中进行报告。光伏组件制造商可将使用此方法获得的数据用于材料验收@工艺开发@设计分析@或故障分析。该方法还可用于检查其他材料@，例如 IEC 62788-2 中所述的背板和前板。 62788-2 中针对该应用指定了测试的某些细节（包括样本尺寸和基材）。 [外文原描述]： IEC 62788-1-5:2016 provides a method for measuring the maximum representative change in linear dimensions of encapsulation sheet material in an unrestricted thermal exposure as might or might not be seen during photovoltaic (PV) module fabrication. Data obtained using this method may be used by encapsulation material manufacturers for the purpose of quality control of their encapsulation material as well as for reporting in product datasheets. Data obtained using this method may be used by PV module manufacturers for the purpose of material acceptance, process development, design analysis, or failure analysis. The contents of the corrigendum of July 2017 have been included in this copy.
英文名称Measurement procedures for materials used in photovoltaic modules - Part 1-5: Encapsulants - Measurement of change in linear dimensions of sheet encapsulation material resulting from applied thermal conditions