低电阻测量方法和指南

[中文适用范围]： 电阻测量通常会受到各种现象的影响，例如测量路径中的串联电阻、自热或非欧姆特性。这种现象对电阻测量的影响是否可接受取决于与电阻和所需精度相比每种影响的大小。因此，随着电阻的减小和允许公差的收紧，错误电阻测量的风险也会增加。本文件规定了测量方法和相关的测试条件，以消除或减少不利现象的影响，以提高低电阻测量可达到的精度。本文档中描述的方法适用于单个电阻器电阻的单独测量，也适用于作为测试序列一部分的电阻测量。如果相关组件规范@规定或客户和制造商同意，则应用它们。 [外文原描述]： IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer. The contents of the corrigendum of March 2020 have been included in this copy.