标准摘要
[中文适用范围]： 该标准描述了表征有机电子器件的方法@包括测量技术@报告数据的方法@以及表征过程中的测试条件。目的 该标准的目的是提供一种系统表征有机晶体管的方法。这些标准旨在通过提供测试有机器件的框架来最大限度地提高已发布结果的可重复性，有机器件的独特性能会导致无机器件通常不会遇到的测量问题。该标准强调公开用于测量数据和提取参数的程序，以便可以轻松评估数据质量。该标准还制定了报告数据@的指南，以便整个研究界和行业的信息清晰一致。 [外文原描述]： IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
英文名称Test methods for the characterization of organic transistors and materials