印刷电子 - 第203-2部分: 材料 - 半导体油墨 - 印刷有机半导体层中空间电荷限制迁移率的测量

[中文适用范围]： IEC 62899-203-2:2025 规定了使用空间电荷限制电流（SCLC）迁移率技术，测量印刷半导体层中有效载流子迁移率值的方法。该方法旨在作为基准测试，以便在特定温度下对不同材料、材料配方和制造工艺的平面结构器件进行可重复的表观载流子迁移率测量和比较。本文件规定了样品和设备的要求，描述了测量技术、数据分析程序以及报告协议。本文件适用于单极性器件（即仅空穴或仅电子器件），其中电荷注入效率较高，且串联电阻不主导电流-电压曲线。因此，该方法不适用于测试高电子迁移率器件（电子注入可能存在问题）、高度掺杂材料（空间电荷限制电流不存在）或需要横向电荷传输的应用（例如晶体管）中的迁移率评估。 [外文原描述]： IEC 62899-203-2:2025 specifies a method to measure the values of effective charge carrier mobility in printed semiconductive layers using space charge limited current (SCLC) mobility technique. The method described is intended to be used as a benchmark test to allow reproducible measurements at a given temperature of the apparent charge carrier mobility for comparison with devices that use different materials, material formulations and fabrication processes for a planar configuration. This document specifies the sample and equipment requirements, and describes the measurement technique, the data analysis procedure and the reporting protocol. This document is suitable to test unipolar devices (i.e. hole-only or electron-only), where charge injection is efficient and where series resistance does not dominate the current-voltage curve. Therefore, it cannot be used for testing high-electron mobility devices where electron injection can be problematic, for testing highly doped materials where space charge limited current does not exist, or to evaluate mobility in applications that require lateral charge transport, such as in transistors.