标准摘要
[中文适用范围]： This part of IEC 62899 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. [外文原描述]： IEC 62899-203:2024 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition: a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device; b) in 6.3.2, correction of formula for calculation of permittivity.
英文名称Printed electronics - Part 203: Materials - Semiconductor ink