标准摘要
[中文适用范围]： IEC 62899 的此部分定义了术语并指定了表征和评估半导体墨水以及由半导体墨水制成的半导体层的标准方法。 [外文原描述]： IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition: a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device; b) in 6.3.2, correction of formula for calculation of permittivity.
英文名称Printed electronics - Part 203: Materials - Semiconductor ink