标准摘要
[中文适用范围]： 本部分IEC 62899规定了印刷薄膜晶体管(TFT)或有机薄膜晶体管(OTFT)的位移电流测量(DCM)的测试方法。 [外文原描述]： IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
英文名称Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor