标准摘要
[中文适用范围]： IEC 62951的本部分规定了在膨胀情况下评估柔性基板上薄膜晶体管特性的方法。薄膜晶体管是在柔性基板上制造的，包括聚对苯二甲酸乙二醇酯（PET）@聚酰亚胺（PI）@弹性体等。通过使用设备向柔性基板施加均匀分布的压力来施加应力。 [外文原描述]： IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
英文名称Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging