标准摘要
[中文适用范围]： IEC 62951的本部分规定了弯曲和折叠测试下柔性导电薄膜的方块电阻的术语@以及测试方法和报告。测量方法包括2点探针@4点探针和蒙哥马利法@，可应用于原位和异位测量以及各向异性方块电阻的测量。 [外文原描述]： IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
英文名称Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films