标准摘要
[中文适用范围]： IEC 62951的这一部分规定了评估条件，并给出了测量方法以及在平坦和弯曲条件下测量超低渗透率薄膜层阻隔性能的测试装置。本文件还包括样本@电触点@传感器薄膜的制备和计算程序。为此，本文件提供了术语@定义@符号@配置@和测试方法，包括测试条件，例如温度@相对湿度@测试时间。 [外文原描述]： IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra‑low permeation rate under both flat and bending conditions. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.
英文名称Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor