射频（RF）应用中表面声波（SAW）和体声波（BAW）器件功率耐久性测量方法指南

[中文适用范围]： 本文档定义了用于确定射频（RF）表面声波（SAW）和体声波（BAW）器件（如滤波器和双工器）在高功率射频信号下的耐久性的测量方法，这些器件用于电信、测量设备、雷达系统和消费产品。RF BAW器件包括两种类型：基于薄膜体声波谐振器（FBAR）技术和基于固态 mounted谐振器（SMR）技术的器件。本文档包括RF SAW/BAW器件故障的基本特性，以及建立测量系统和确定失效时间（TF）估计程序的指南。由于TF主要受器件中施加的射频功率控制，讨论集中在功率耐久性上。本文档的目的不是解释理论，也不是试图涵盖实际情况下可能出现的所有情况。本文档提醒用户，在为新应用订购RF SAW/BAW器件之前，需要考虑一些更基本的问题。该程序将是用户防止由于RF SAW/BAW器件暴露于高功率而导致过早故障引起性能不佳的手段。 [外文原描述]： IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.