标准摘要
[中文适用范围]： 该文件涉及一种在微波和毫米波频率下介电基板的复介电常数的测量方法。该方法用于评估微波和毫米波电路中使用的低损耗材料的介电性能 [外文原描述]： IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.
英文名称Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method