低损耗介质基板平衡型圆盘谐振器法测量复介电常数

[中文适用范围]： IEC 63185:2025 RLV 包含官方 IEC 国际标准及其红线版。红线版仅提供英文版，可让您快速轻松地比较官方 IEC 标准与其先前版本之间的所有更改。IEC 63185:2025 涉及微波和毫米波频率下介电基板复介电常数的测量方法。该方法旨在评估微波和毫米波电路和设备中使用的低损耗材料的介电性能。它使用平衡型圆盘谐振器的高阶模式，并使用一个谐振器提供介电基板的宽带测量，其中在模式匹配分析的基础上准确考虑了激励孔和边缘场的影响。第二版取消并取代了 2020 年发布的第一版。此版本构成技术修订。此版本与前一版本相比包括以下重大技术变化：a)适用频率范围的上限从 110 GHz 扩展到 170 GHz；b)用于测量的圆盘谐振器现在包括具有波导接口的谐振器；c)在根据测量的谐振特性计算复介电常数时，现在基于模式匹配分析准确地考虑了边缘场。 [外文原描述]： IEC 63185:2025 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 63185:2025 relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis. This second edition cancels and replaces the first edition published in 2020. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz; b) circular disk resonators used for the measurements now include one with waveguide interfaces; c) in calculating the complex permittivity from the measured resonant properties, the fringing fields are now accurately taken into account based on the mode-matching analysis.