标准摘要
[中文适用范围]： IEC 63287的这一部分给出了半导体集成电路产品可靠性鉴定计划的指南。本文档不适用于军事和太空相关应用。 [外文原描述]： IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project. This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts); a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
英文名称Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification