电气和电子设备连接器 测试和测量 第 27-200 部分：IEC 60603-7 系列连接器上高达 2000 MHz 的信号完整性测试的附加规范 测试 27a 至 27g

[中文适用范围]： IEC 60512 的这一部分涵盖了 IEC 60512-27-100 的信号完整性和传输性能测试方法的附加补充规范，适用于使用去嵌入串扰测量的连接器，这些规范在连接硬件的 IEC 60603-7 标准的相应部分中指定应用高达 2000 MHz。这些附加规范也适用于测试相关的低频连接器。然而，任何给定连接器的详细规范中指定的测试方法仍然是该连接器的参考一致性测试。受这些补充方法和程序影响的 IEC 60512-27-100 测试程序为：插入损耗，测试 27a；回波损耗，测试 27b；近端串扰（NEXT）测试27c；远端串扰（FEXT），测试27d；横向转换损耗（TCL），测试27f；横向转换传输损耗 (TCTL)，测试 27g。这里引用的其他测试程序是：传输阻抗 (ZT)，请参阅 IEC 62153-4-6 或 IEC 62153-4-7 中的测试程序；对于耦合衰减 (aC)，请参阅 IEC 62153-4-7 或 IEC 62153-4-12 中的测试程序。 [外文原描述]： IEC/PAS 60512-27-200:2018 covers additional, supplemental specifications for signal integrity and transmission performance test methods of IEC 60512-27-100, for connectors using de-embedded crosstalk measurements, which are specified in respective parts of IEC 60603-7 standards for connecting hardware applications up to 2 000 MHz. These additional specifications are also applicable for testing the related lower frequency connectors. However, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. Test procedures of IEC 60512-27-100 affected by these supplemental methods and procedures are: • insertion loss, test 27a; • return loss, test 27b; • near-end crosstalk (NEXT) test 27c; • far-end crosstalk (FEXT), test 27d; • transverse conversion loss (TCL), test 27f; • transverse conversion transfer loss (TCTL), test 27g. Other test procedures referenced here are: • transfer impedance (ZT), see test procedures in IEC 62153-4-6 or IEC 62153-4-7. • for coupling attenuation (aC), see test procedures in IEC 62153-4-7 or IEC 62153-4-12. Keywords: Connector, Signal Integrity