标准摘要
[中文适用范围]： 微波电路通常形成在多层有机或无机基板上。在微波电路中，带状线、微带线和共面线等平面传输线的衰减由它们的导体损耗、介电损耗和辐射损耗决定。其中，导体损耗是平面传输线衰减的主要因素。需要一种新的测量方法来评估有机基板、陶瓷基板和LTCC（低温共烧陶瓷）基板等基板上或基板内的传输线的电导率。 [外文原描述]： IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.
英文名称Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency