标准摘要
[中文适用范围]： 主要涉及各类电子元件、组件及整机设备，旨在帮助制造商和质量控制部门在产品开发与验证阶段及时发现问题，提升产品在复杂环境下的可靠性。相关技术要求确保了试验过程的一致性与数据结果的可比性，为行业内产品的质量评估提供了共同遵循的准则。 [外文原描述]： The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
英文名称Highly-accelerated temperature and humidity stress test (HAST)