标准摘要
[中文适用范围]: 描述了在计算机控制仪器上执行标准晶圆级电迁移加速测试 (SWEAT) 的算法。所描述的算法代表了一种执行 SWEAT 的方法。其他算法的开发和使用可能会产生令人满意的加速电迁移测试结果。 [外文原描述]: Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to the execution of SWEAT. Development and employment of other algorithms may produce satisfactory accelerated electromigration test results.
英文名称A procedure for executing SWEAT