标准摘要
[中文适用范围]： 提供故障机制及其相关激活能或加速因子的列表，当唯一可用数据基于在加速压力测试条件下执行的测试时，可用于进行系统故障率估计。所使用的方法是故障率总和法。 [外文原描述]： Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.
英文名称Failure mechanisms and models for silicon semiconductor devices