标准摘要
[中文适用范围]： 旨在确定在不施加电应力的情况下在高温下存储对固态电子器件的影响。该测试被认为是破坏性的。 [外文原描述]： Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
英文名称High temperature storage life