标准摘要
[中文适用范围]： 本技术报告详细说明了一种能够监测半导体老化并表征老化水平的性能评估存储元件@的设计技术。估计的老化水平可用于提高系统的可靠性。 [外文原描述]： IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
英文名称Semiconductor devices - Scan based ageing level estimation for semiconductor devices