标准摘要
[中文适用范围]： IEC TR 63571:2025 描述了一种根据“部件”级寿命计算“系统”级寿命的方法。文中提供了通用的数学理论和简单的计算示例，以供教学参考。在与“系统”级寿命相关的元素中，诊断等软件相关元素不在本文档的讨论范围内。 [外文原描述]： IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.
英文名称Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”