集成电路.电磁辐射的测量.第3部分:放射形辐射测量.表面扫描法

[中文适用范围]： 本 IEC 61967 的一部分提供了一项测试程序，定义了评估集成电路 (IC) 表面或附近表面的近场电场、磁场或电磁场分量的方法。此诊断程序旨在用于 IC 架构分析，如布局规划和电源分配优化。该测试程序适用于对安装在扫描探针可访问的任何电路板上的 IC 进行的测量。在某些情况下，不仅扫描 IC 本身及其环境也是有用的。为了比较不同 IC 之间的表面扫描发射，应使用 IEC 61967-1 中定义的标准化测试板。该测量方法提供了 IC 上方电场或磁场近场发射的映射。测量的分辨率取决于测量探针的能力以及探针定位系统的精度。该方法 intended 用于高达 6 GHz 的频率。使用现有的探针技术扩展频率上限是可能的，但这超出了本规范的范围。测量可以在频域或时域进行。 [外文原描述]： IEC TS 61967-3:2014 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to measurements on an IC mounted on any circuit board that is accessible to the scanning probe. In some cases it is useful to scan not only the IC but also its environment. For comparison of surface scan emissions between different ICs, the standardized test board defined in IEC 61967-1 should be used. This measurement method provides a mapping of the electric or magnetic near-field emissions over the IC. The resolution of the measurement is determined by the capability of the measurement probe and the precision of the probe-positioning system. This method is intended for use up to 6 GHz. Extending the upper limit of frequency is possible with existing probe technology but is beyond the scope of this specification. Measurements may be carried out in the frequency domain or in the time domain. This edition includes the following significant technical changes with respect to the previous edition: a) Removal of: Clause 9.4 Data analysis and Annex D Analysing the data from near-field surface scanning; b) Addition of: Introduction, Clause 9.4 Measurement data, Clause 9.5 Post-processing, Clause 9.6 Data exchange and Annex D Coordinate systems; c) Expansion of: Clause 8.4 Test technique and Annex A Calibration of near-field probes.