集成电路.脉冲抗扰度的测量.第2部分:同步瞬时注射法

[中文适用范围]： IEC/Ts 62215-2 是一项技术规范，包含评估集成电路（IC）对快速传导同步瞬态骚扰的抗扰度的测试方法的一般信息和定义。该信息后面是测量条件的描述，试验设备和试验装置以及试验程序和试验报告内容的要求。本技术规范的目的是描述获得 IC 抗扰度定量测量的一般条件，建立统一的测试环境。描述了预期影响测试结果的关键参数。与本规范的偏差应在单独的说明中明确注明测试报告。这种同步瞬变抗扰度测量方法，如本规范所述。在导电模式下，使用具有不同幅度、持续时间和极性的快速上升时间的短脉冲到 IC。在这种方法中，所施加的脉冲应与 IC 的活动同步，以确保可以保证受控和可再现的条件． [外文原描述]： Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured