标准摘要
[中文适用范围]： 本技术规范的目的是提供与微电子设备测试相关的指导，以测量其对大气中子引起的单粒子效应 (SEE) 的敏感性。由于测试可以使用不同种类的辐射源以多种不同的方式进行，因此它还展示了如何使用测试数据来估计由于飞机高度处大气中的大气中子而导致的设备和电路板的 SEE 率。 [外文原描述]： IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
英文名称Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems