标准摘要
[中文适用范围]： 本部分IEC TS 62607（技术规范）规定了评估有机/纳米材料中各种电荷载流子浓度所需的样品结构。本规范提供了用于金属/绝缘体/半导体（MIS）叠层结构的电容-电压（C-V）测量和基于范德堡（van der Pauw）配置的霍尔效应测量的方法。文档中还给出了在有机半导体层中选择电荷载流子浓度测量方法的标准。 [外文原描述]： IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
英文名称Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration