标准摘要
[中文适用范围]： 本部分 IEC TS 62607 建立了一种标准化方法，用于通过拉曼光谱法确定由石墨烯基材料组成的粉末的结构关键控制特性——缺陷水平。缺陷水平是根据拉曼光谱中 D+D′带和 2D 带的强度比 I_D+D′/I_2D 得出的。根据本文件确定的缺陷水平将作为石墨烯粉末 IEC 62565-3-1 空白明细规格书中的关键控制特性列出。该方法适用于石墨烯粉末或石墨烯基材料，例如还原氧化石墨烯（rGO）、双层石墨烯、三层石墨烯和少层石墨烯。典型的应用领域是石墨烯制造商的质量控制和分类，以及下游用户的产品选择。本文描述的方法适用于石墨烯的物理形式为粉末的情况。 [外文原描述]： IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic • defect level for powders consisting of graphene-based material by • Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D. • The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder. • The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene. • Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users. • The method described in this document is appropriate if the physical form of graphene is powder.
英文名称Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy